Estoy desarrollando una aplicación basada en F28035 con CCSv6 . La primera versión del software se desarrolló utilizando el Experimenter Kit junto con la F28035 ControlCARD .
En la segunda etapa de desarrollo, ControlCARD debe conectarse en un hardware de desarrollo propio. La conexión de hardware (USB) se basa en el mismo hardware presente en el Experimenter Kit (FT2232 - Adaptador FTDI). Cuando quiero descargar el software de CCSv6 , al hardware de desarrollo propio, aparece el siguiente mensaje de error:
C28xx: Error connecting to the target: (Error -1135 @ 0x0) The emulator
reported an error. Confirm emulator configuration and connections, reset the
emulator, and retry the operation. (Emulation package 5.1.507.0)
Luego ejecuté una prueba de conexión de CCSv6 , que obtuvo el siguiente resultado:
[Start: Texas Instruments XDS100v1 USB Emulator]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]
-----[Print the board config pathname(s)]------------------------------------
/home/martin/.ti/ti/0/0/BrdDat/testBoard.dat
-----[Print the reset-command software log-file]-----------------------------
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'libjioserdesusb.so'.
The library build date was 'May 21 2014'.
The library build time was '13:04:29'.
The library package version is '5.1.507.0'.
The library component version is '35.34.40.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
-----[Print the reset-command hardware log-file]-----------------------------
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
-----[The log-file for the JTAG TCLK output generated from the PLL]----------
There is no hardware for programming the JTAG TCLK frequency.
-----[Measure the source and frequency of the final JTAG TCLKR input]--------
There is no hardware for measuring the JTAG TCLK frequency.
-----[Perform the standard path-length test on the JTAG IR and DR]-----------
This path-length test uses blocks of 512 32-bit words.
The test for the JTAG IR instruction path-length succeeded.
The JTAG IR instruction path-length is 39 bits.
The test for the JTAG DR bypass path-length succeeded.
The JTAG DR bypass path-length is 2 bits.
-----[Perform the Integrity scan-test on the JTAG IR]------------------------
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.
The JTAG IR Integrity scan-test has succeeded.
-----[Perform the Integrity scan-test on the JTAG DR]------------------------
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.
The JTAG DR Integrity scan-test has succeeded.
[End: Texas Instruments XDS100v1 USB Emulator]
En esta salida, no se observa ningún informe de errores. Sin embargo, hay una diferencia con la misma ejecución de prueba para Experimenter kit .
En este caso (hardware de desarrollo propio), el parámetro "JTAG IR instrucción longitud de ruta" es 39, mientras que para el Experimenter Kit es 38, y el parámetro "JTAG DR pasa por alto la ruta de longitud "es 2, mientras que para el Experimenter Kit es 1. No sé si esto puede causar el error, pero es la única diferencia que veo entre Experimenter Kit y el hardware de desarrollo propio. El kit de experimentación funciona bien, el hardware no lo ha desarrollado por sí mismo.
Por supuesto, lo verifiqué con una actividad de osciloscopio en 5 líneas de JTAG.
¿Alguien puede sugerir alguna idea?